Activities in Publications

Guest Editor's Introduction to the 2010 IEEE Transactions on Computers Special Section on "Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems"

    • (2018-2020) Editor in Chief of the IEEE Transactions on Emerging Topics in Computing
    • (2013-2016) Editor in Chief of the IEEE CS Computing Now on-line magazine (starting the introduction of: Chinese and Spanish translations,  multilanguage audio versions, and industrial videos on Monthly Themes)
    • (2007-2012) Associate Editor in Chief of the IEEE Transactions on Computers
    • (2015-present) Member of the Editorial Advisory Board of the IEEE The Institute
    • (2017-current) Member of the Steering Committee of Computing Now
    • (2015-current) Member of the Editorial Board of the IEEE Design & Test
    • (2015-current) Associate Editor of the Journal Design Automation for Embedded Systems, Springer
    • (2014-current) Associate Editor of the IEEE Transactions on Computers
    • (2004-2006) Member of the Editorial Board of the IEEE Transactions on Computers
    • (2004-present) Member of the Editorial Board of the Journal of Electronic Testing: Theory and Applications (JETTA)
    • (2013-2014) Member of the Editorial Board of the ACM Transactions on Design Automation of Electronic Systems (TODAES)
    • (2000 – 2009) Member of the Editorial Board of the Microelectronics Journal, Elsevier Science
    • (2007-present) Member of the Editorial Board of the International Journal of Highly Reliable Electronic System Design, International Sciences Press
    • Guest Editor/Co-Editor of the:
      • Monthly Theme on "Data Storage Reliability in the IoT Era", of Computing Now, August 2017
      • Special Issue on "High Dependability Systems" of the IEEE Transactions on Emerging Topics in Computing (together with M. Sonza Reorda, Politecnico di Torino, Italia), to appear in 2017
      • Special Issue on "Emerging Trends and Design Paradigms for Memory Systems and Storage" of the IEEE Transactions on Emerging Topics in Computing (together with R. Aitken, ARM, USA), to appear in 2017
      • Monthly Theme on "When Radiation Hits Electronic Circuits", of Computing Now, July 2016
      • Monthly Theme on "Are Our Electronic Circuits Getting Older?" of Computing Now, September 2015
      • Special Section on "Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems" of the IEEE Transactions on Computers, Third Section of 2010 (together with R. Galivanche (Intel Corporation (USA))
      • Monthly Theme on "Microprocessor Test and Reliability Challenges" of Computing Now, December 2013
      • Special Issue on the “Innovations in Testing” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2012
      • Special Issue on “Testing” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2011
      • Special Issue on the “IEEE European Test Symposium 2009” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2010
      • Special Issue on the “IEEE European Test Symposium 2008” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2009
      • Special Section on “Computer-Aided Design for Emerging Technologies” of the IEEE Design & Test, July-August 2007 (together with F. Lombardi, Northeastern Univ, Boston (USA))
      • Special Issue on "Design and Test of Systems-On-a-Chip (SOC)" of the IEEE Transactions on Computers, May 2006 (together with JC Lo (University of Rhode Island, Rhode Island (USA) and F. Lombardi, Northeastern University, Boston (USA))
      • Special Issue on “On-Line Testing and Fault Tolerance” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2005 (together with R. Leveugle, Imag, Grenoble (France))
      • Special Issue on “Testing at MultiGbit/s Rates” of the IEEE Design & Test, July-August, 2004 (together with A. Ivanov (British Coloumbia University, Vancouver (CA)) and F. Lombardi, Northeastern University, Boston (USA))
      • Special Issue on “On-Line Testing” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2004 (together with M. Sonza Reorda, Politecnico di Torino, Italy)
      • Special Issue on the “8th IEEE International On-Line Testing Workshop” of The Journal of Electronic Testing: Theory and Applications (JETTA), 2003 (together with M. Sonza Reorda, Politecnico di Torino, Italy)
      • Special Issue on the “7th IEEE International On-Line Testing Workshop” of The Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 18, n. 3, June 2002 (together with D. Nikolos (Univ. of Patras, Greece), J. P. Hayes (Univ. of Michigan, USA) and M. Nicolaidis (iRoC Techn., France))
      • Special Issue on “Defect-Oriented Diagnosis for Very Deep Submicron Systems” of the IEEE Design & Test, January-February, 2001 (together with F. Lombardi, Northeastern University, Boston, USA)

https://events.unibo.it/cecilia-metra-2018-ieee-computer-society-president-elect-candidate