Keynotes/Invited Speeches/Panels

Invited Speaker at IEEE Region 10 webinar series (R10Talk), August 5, 2023, Online, with the talk entitled “Reliability and Safety Challenges for the AI Hardware to Enable the Future Metaverse"
Invited Distinguished Lecturer Talk for the IEEE Consumer Technology Society, IEEE Product Safety Engineering Society, IEEE Broadcast Technology Society, July 31, 2023, Online, with the talk entitled “Hardware Reliability and Safety Challenges to Enable a Reliable and Safe AI"
Invited Talk as Division V Director, at the IEEE Region 8 Meeting, March 24-26, 2023
Invited Keynote (Visionary Talk) at theACM/IEEE 60^th Design Automation Conference - DAC, July 9-13, 2023, San Francisco (California), with the talk entitled “AI Hardware Reliability and Safety Challenges to Enable the Future Metaverse"
Invited Speaker at theIEEE Advanced School on Nanotechnology-based Computing, October 21-22, 2022 Crete (Greece), with the talk entitled “Dependability Risks of Nanotechnology Based-Computing for Intelligent Systems"
Invited Speaker at the22^ndAnnual Conference of the National Association of Risk Managers and Corporate Insurance Managers - ANRA, Milan (Italy), October 24-25, 2022, with the talk entitled “Sfide per l’Affidabilità, la Safety e la Sicurezza di Sistemi Autonomi guidati da Intelligenza Artificiale"
Invited Panelist at the IEEE International Symposium on Technology and Society”, panel entitled “In celebration of SSIT’s 50th Anniversary”, 10-12 November, 2022 (virtual)
Invited Speaker at the IEEE Region 10 Humanitarian Technology Conference 2022, September 16-18, 2022, Hyderabad (India), with the talk entitled “Safety, Reliability and Security Risks for Highly Autonomous Intelligent Systems"
Invited Panelist at the IEEE World Congress on Computational Intelligence - Industry Day, panel entitled “Technological and Regulatory Challenges for AI in Europe", July 20, 2022, Padova (Italy)
Invited Panelist at the Conference COMPSAC 2022, plenary panel entitled “Reliability of Autonomous Machines", online, June 27^th – July 1st, 2022
Invited Panelist at the Conference COMPSAC 2022, plenary panel entitled “Technology Predictions", online, June 27^th – July 1st, 2022
Invited Talk entitled “Circuit Level Challenges and Solutions for Safe and Reliable Intelligent Systems” at the ACM Workshop on Robustness and Safe Software 2.0 (RSS2) 2022, held online, February 28, 2022
Keynote Speaker at The 15th IEEE International Conference on Application of Information and Communication Technologies (AICT2021), held online, October 13-15, 2021, with the talk entitled “Safety, Reliability and Resiliency Challenges for Highly Autonomous Intelligent Systems"
Keynote Speaker at the 4th International Conference on Recent Developments in Control Automation and Power Engineering (RDCAPE) 2021, October 7-8, 2021, held online, with the talk entitled “Safety, Reliability and Resiliency Challenges to Enable a Smarter World"
Keynote Speaker at the 31st International Conference on Field- Programmable Logic and Applications 2021, held online, September 1-3, 2021, with the talk entitled “Safety, Reliability and Resiliency Challenges to Enable Highly Autonomous Intelligent Systems"
Keynote Speaker at the IEEE Computer Society Conference on Computers, Software and Applications (COMPSAC) 2021, held online, July 12-16, 2021, with the talk entitled “Safety and Resiliency Challenges for Highly Autonomous Intelligent Systems"
Invited Talk entitled “Safety and Reliability Challenges for Dependable Highly Autonomous Systems” at IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) 2021, held online, July 9-11, 2021
Invited Panel Moderator at the Clust-ER Mech, Emilia Romagna (Italy) Workshop "La Guida Autonoma nella Auto e nei Veicoli per l’Agricoltura”, held online, March 22, 2021
Invited Panelist at the Conference COMPSAC 2021, plenary panel entitled “President’s Panel", online, July 12-16, 2021
Invited Panelist at the Singapore Week of Innovation & Technology (SWITCH) Conference panel entitled “Technology Predictions for Times of Pandemics", held online, December 7-11, 2020
Keynote Speaker at the Applications in Electronics Pervading Industry, Environment and Society (APPLEPIES) 2020, held online, November 19-20, 2020, with the talk entitled “Safety and Reliability Challenges to Enable a Smarter World"
Invited Talk entitled “Safety and Reliability Challenges to Enable Highly Autonomous Intelligent Systems” at IEEE CASS webinars, hosted by Rio Grande do Sul Chapter, held online, 6 November, 2020
Keynote Speaker at the Women in Engineering Global Summit 2020, held online, November 5, 2020, with the talk entitled “Reliability and Safety Challenges for Highly Autonomous Intelligent Systems"
Invited Talk held online, 17 October 2020, at the “International Symposium on Frontiers Trends on Information and Computer Technology in Society” 2020, IEEE Indonesia Computer Society Chapter, with the talk entitled “Being Part of the IEEE Computer Society in the Pandemic Emergency Year"
Invited Talk at the “Emergence of IEEE CS and Field of Computing in the past 7 Decades Curtain Raiser Meet at R10”, held online, 10 October 2020, with the talk entitled “Emergence of IEEE Computer Society in past 7 decades"
Invited Panelist at the Conference COMPSAC 2020 plenary panel entitled “To Patent or Not to Patent?", held Online, July 13-17, 2020
Distinguished Speaker at the Women in Technology Forum of the China National Computer Congress (CNCC) 2019, Suzhou (China), October 17-19, 2019, with the talk entitled “Reliability and Safety Challenges for Autonomous Intelligent Systems with Intelligence at the Edge"
Invited Welcome Message at the China National Computer Congress (CNCC), Suzhou (China), October 17-19, 2019
Keynote Speaker at the World Congress on Information Technology 2019, Yerevan (Armenia), October 6-9, 2019, with the talk entitled “Reliability, Safety, Security and Time Determinism Challenges for Autonomous Intelligent Systems of a Smarter World"
Invited Lecturer at the Yerevan State University, Yerevan (Armenia), October 9, 2019, with the talk entitled “Reliability and Safety Challenges in the IoT Era"
Invited Talk at Synopsys, Yerevan (Armenia), October 9, 2019, with the talk entitled “Addressed Challenges in Test, Reliability, Security and Energy Efficiency of Electronic Systems"
Invited Talk at Intel, Beijing (China), October 15, 2019, with the talk entitled “Addressed Challenges in Test and Reliability of High Performance Electronic Systems"
Invited Panelist at the 5^th International Forum on Research and Technologies for Society and Industry 2019 plenary panel entitled “Be an entrepreneur in hot technological areas", with the presentation entitled “Hardware Information Processing Systems”, Florence (Italy), 9-12 Settembre, 2019
Invited Congress Opening Remarks at the IEEE World Congress on Services 2019, Milan (Italy), 8-13 July, 2019
Invited Panelist at the Conference COMPSAC 2019 plenary panel entitled “President’s Panel: IEEE Computer Society Volunteerism & Membership – Serving Humanity with Technology", Milwaukee (USA), July 15-19, 2019
Invited Panelist at the IEEE World Congress on Services 2019 plenary panel entitled “2020 Tech Predictions", Milan (Italy), 8-13 July, 2019
Invited Talk at the Artemis Technology Conference 2019, Amsterdam (The Netherlands), 16-17 April 2019, with the talk entitled “Reliability Challenges for Secure and Safe Cyber-Physical Systems and IoT Devices"
Keynote Speaker at the IPSJ's 81st National Congress, Fukuoka (Japan), 14-16 March 2019, with the talk entitled “Reliability Challenges for High Performance Microprocessors in the IoT Era"
Invited Talk at Yokohama Research Laboratory, Hitachi, Yokohama (Japan), 13 March 2019, with the talk entitled “Reliability Challenges for Microprocessors and Memories in the IoT Era"
Keynote Speaker at the IEEE Fruct Conference 2018, Bologna (Italy), November 14, 2018, with the talk entitled “Reliability Challenges for High Performance Electronic Systems in the Internet of Things Era"
Invited Talk at Alibaba, Hangzhou (China), September 5, 2018, with the talk entitled: “Reliability Challenges for Electronic Circuits and Systems in the Internet of Things Era”
Invited Talk at the Baidu ABC Summit, Shanghai (China), September 4, 2018, with the talk entitled:“Reliability Challenges for Electronic Systems in the Big Data Era"
Invited Talk at Baidu R&D Center, Shanghai (China), September 4, 2018, with the talk entitled: “Electronics’ Reliability Challenges in the Internet of Things Era”
Invited Talk at the International Symposium on Future of Computer Technology 2018 (ISFCT2018), July 24, 2018, Tokyo (Japan), with the talk entitled:“Reliability Challenges for High Performance Electronics in the Internet of Things Era"
Invited Lecture at the International PhD School, University Federico II, Naples (Italy), June 19, 2018, with the lecture entitled: “Reliability Challenges for VLSI Circuits and Systems"
Invited Talk at the SPS IPC Drivers 2017, May 24, 2017, Parma (Italy), with the talk entitled:“Technologies for Big Data and Internet of Things"
Keynote Speaker with the talk entitles “Test and Reliability Challenges for High Performance, Nanotechnology Circuits and Systems", at the IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Košice (Slovakia), April 20-22, 2016
Distinguished Lecturer with the talk entitled “Test and Reliability Challenges for High Performance Circuits and Systems", at the 48^th Annual Meeting of the Associazione Gruppo Italiano di Elettronica, Brescia (Italy),June 22-24, 2016
Invited Talk “Test and Reliability Challenges for Advanced Circuits and Systems", at the University of Padova (Italy), December 11, 2015
Invited Talk “Test and Reliability Challenges of New Generation Circuits and Systems", at the University of Padova (Italy), December 5, 2014
Invited Talk “Test and Reliability Challenges for High Performance Circuits and Systems", at the University of Padova (Italy), January 23, 2014
Invited Talk Speaker at the 3^rd IEEE Workshop on Design for Reliability and Variability (DRV), Dana Point (California), May 4-5, 2011 with the talk entitled:"Process Parameter and Clock Variations: How Can We Deal with Them in High Performance Microprocessors”
Invited Talk “Design for Testability and Reliability of High Performance Circuits and Systems", at the University of Padova (Italy), January 24, 2013
Invited Talk at Hewlett-Packard,Palo Alto (CA, USA), December 7th, 2012, with the talk entitled: “Fault-Tolerance for Highly Reliable Circuits and Systems”
Invited Talk at 3SUN,Catania (Italy), September 8th, 2011, with the talk entitled: “Faults and Fault-Tolerance for Photovolatic Systems"
Invited Talk at STMicroelectronics,Catania (Italy), September 8th, 2011, with the talk entitled: “Fault and Degradation Modelling for Nanoscale ICs”
Invited Talk “Test and Reliability Challenges for General Purpose Nanoscale ICs", at the University of Padova (Italy), December 1, 2011
Invited Talk Speaker at the IEEE East-West Design & Test International Symposium, St Petersburg (Russia), September 17-20, 2010 with the talk entitled: "Secure Communication Protocol for Wireless Sensor Networks”
Invited Talk entitled: “On-Die Measurement of Process Parameter Variations and Clock Jitter”, at the “Elevator Talks” Session of the IEEE International Test Conference 2010, Austin (TX, USA), October 31- November 5, 2010
Invited Talk Speaker at the Workshop on Dependable and Secure Nanocomputing 2009 (WDSN09),Estoril (Portugal), June 29, 2009, with the talk entitled: "Trading Off Dependability and Cost for Nanoscale High Performance Microprocessors: The Clock Distribution Problem”
Invited Talk Speaker at the IEEE East-West Design & Test International Symposium, Moscow (Russia), September 18-21, 2009 with the talk entitled: "Dependable High Performance Microprocessors: The Clock Distribution Challenge”
Embedded Tutorial Speaker at the NASA/ESA Conference on Adaptative Hardware and Systems (AHS-2009), San Francisco(California), July 29 – August 1, 2009, with the tutorial entitled: "On-Die Calibration and Self-Correcting Approaches for Reliable Clock Distribution Networks of High Performance Microprocessors" (together with Simon Tam and TM Mak, Intel Corporation)
Invited Talk entitled "Rad-Hard: Accurate Liner Model for SET Critical Charge Estimation", at ST Microelectronics, Catania (Italy), September 14th, 2010
Invited Talk entitled: “Low-Cost Control-Oriented Concurrent Error Detection Schemes for
RAS, Debug and Test”, at Intel Corporation, Santa Clara (CA), February 27th, 2009
Invited Talk entitled “Design and Test Challenges for General Purpose Nanoscale Systems", at the University of Padova (Italy), November 25, 2009
Invited Talk entitled: “Soft Errors: Risks and Remedies for Next Generation ICs”, at CISCO, San Josè (CA), February 25^th, 2009
Invited Talk “IC Design and Testing Challenges with Technology Scaling", at the University of Padova (Italy), November 13, 2008
Invited Talk entitled: “New Low Cost Approach for High Performance Microprocessor Concurrent Error Detection”, at the “Elevator Talks” Session of the IEEE International Test Conference 2008, Santa Clara (CA, USA), October 29^th, 2008
Invited Talk entitled “Fault Tolerance and Hardening Approaches to Protect Logic Against Clock Faults and Soft Errors”,at IBM, Poughkeepsie-New York (USA), September 26^th, 2008
Invited Talk entitled "Scaling of Microelectronic Technology: Testing and Design For Testability Challenges for Digital Electronic Circuits ", at the University of Padova (Italy), November 26, 2007
Invited Talk entitled "Testing e Design For Testability di Circuiti Elettronici Digitali", at the University of Padova (Italy), November 30, 2006
Invited Talk entitled "Collaudo e Progettazione Orientata al Collaudo di Sistemi Elettronici Digitali", at the University of Padova (Italy), December 1st, 2005
Invited Talk entitled: “Potentials of Fault Tolerance Paradigms for Scaled ICs’ Faults”, at Intel Corporation, Santa Clara (CA), August 6th, 2004
Invited Tutorial on “Testing and Fault Tolerance", at STMicroelectronics (Switzerland), April 6th, 2004
Invited Talk entitled: “Testing Clock Faults: Those That We Might Have Missed”, at Intel Corporation, Santa Clara (CA),December 8th, 2004
Invited Talk entitled "Can High Performance Be Achieved Without Reliability Risks ?" at Philips Research Labs., Eindhoven (The Netherlands), March 17th, 2003
Invited Talk entitled “Will Soft Errors Become a Problem and How Could We Solve It ?", Intel Corporation (MA), November 6th, 2003
Invited Talk entitled "Faults on the Clock Distribution Network and Their Impact on Testing" at Artisan Components, Sunny Valley (CA, USA), November 21st, 2002
Invited Talk entitled "Hardware Solutions for the Concurrent Detection of Transient, Crosstalk and Delay Faults in VDSM ICs" at Agere Systems, Murray Hill (NJ, USA), May 17, 2001
Invited Talk entitled "On-Line Testing for Logic Soft Errors: A Better Way", at the Intel Test Research Symposium, Intel, Santa Clara (CA), September 29th, 2000
Invited Tutorial entitled "Hardware Fault-Tolerance: New Perspectives for Very Deep Sub-Micron Circuits ?", at ST Microelectronics, Agrate (Milan, Italy), July 10th, 2000
Invited Talk entitled "Soft Errors' On-Line Testing: A Low Cost Approach", at LogicVision, San Josè (CA), September 28th, 2000
Invited Talk entitled "Concurrent Testing Techniques for Clock's Faults", at the Intel Research Symposium VLSI Test, Intel, Santa Clara (CA), April 24th, 1998
Invited Talk entitled "Self-Checking Detectors for Faults Escaping Conventional Off-Line and On-Line Testing", at The Boeing Company, Seattle (USA), October 27, 1998
Invited Lesson entitled "Checker Design", at the "European School on High Reliability Integrated Systems", Euroform, Bologna, February 9th, 1994
Invited Lesson on "Reliability and Diagnostics", at the Corso di Perfezionamento Post-Laurea of the CEFRIEL, Politecnico of Milan,June 4-5, 2002
Panelist for thepanel entitled: "Innovation & Cooperation in Europe",of the “14th European Manufacturing Test Conference (EMTC), Semicon Europa”, 9-11 October, 2012, Dresden (Germany), organized by R. Segers, ReSeCo (The Netherlands)
Panelist for thepanel entitled: "How can defect-based test be made to work in a foundry world?", of the IEEE International On-Line Testing Symposium, 7-9 July, 2003, Kos (Greece), organized by R. Aitken, Artisan Components (USA)
Panelist for thepanel entitled: "Mainframe RAS on Desktops : Reality today or tomorrow", of The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Rome (Italy), September 26-28, 2007, organized by Prashant D. Joshi, Intel

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